An on-line archive of articles published in The National Science Foundationís flagship magazine from 1970 to 1992.
 
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All Articles for Topic: Scanning Tunneling Microscopy
Year (Volume & No.)TitleAbstractAuthorDownload
1989 (Volume 20, No. 2)Scanning Tunneling Microscopy: Beyond the Cutting EdgeThe latest in the family of technologies for micron and submicron microscopy is rapidly moving beyond the examination of material surfaces to their manipulation. Applications are tumbling out of the labs. Scanning probe microscopesCharles PetitPDF


 

 
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